Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics
Online ISSN : 2424-2837
セッションID: OS4-1-2
会議情報
OS4-1-2 In-Situ Atomic Force Microscopy and Crystallographic Orientation Analysis of Small Fatigue Crack Deflection Behavior
A. SugetaM. Jono
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会議録・要旨集 フリー

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Successive observation of transgranular small fatigue crack growth behavior of alpha-brass was performed by means of an atomic force microscope (AFM) equipped with small in-plane bending fatigue testing machine. The fatigue crack deflection behavior, which was observed frequently in the low growth rate region, was investigated by the crystallographic orientation analysis based on the Electron Back Scatter Diffraction (EBSD) technique. The slip factor considering the slip system and singular stress field at the crack tip was introduced in order to evaluate the easiness of slip deformation instead of Schmid factor. The direction of crack deflection was found to be explained well by the slip factor and the geometric relative location between the preferential slip plane and crack front.
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© 2007 一般社団法人 日本機械学会
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