主催: The Japan Society of Mechanical Engineers
会議名: 実験力学の先端技術に関する国際会議 (ATEM'19)
開催日: 2019/10/07 - 2019/10/11
Micro-Raman spectroscopy was an effective tool for the investigation of experimental mechanics. Most of traditional Raman spectroscopes based on the fixed backscattering geometric configuration were scarcely applicable for the complex stress/strain analyses of advanced nanomaterials and microstructures. This work presented the angle-resolved Raman method, which detected the Raman spectra at adjustable inclination angle, rotation angle and polarization angles of the incident laser and scattered lights. A self-built backscattering angle-resolved Raman instrument was established and the theoretical model decoupling the plane stress state of C-Si was proposed. Then, this method was applied on the studies including the analysis of 2-axis stress state on the {100} c-Si, in-strain sensor by using mono-layer graphene, and the chirality identification of phosphorene.
