The Proceedings of The Computational Mechanics Conference
Online ISSN : 2424-2799
2000.13
Conference information
Prediction Method of Electromigration Failure in Passivated Polycrystalline Line by Using Governing Parameter of Electromigration Damage
Kazuhiko SASAGAWA, Masataka HASEGAWA, Masumi SAKA, Hiroyuki ABE
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Keywords: Electromigration Failure, Prediction Method, Governing Parameter, Passivated Polycrystalline Line
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Pages 679-680

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© 2000 The Japan Society of Mechanical Engineers
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