The Proceedings of The Computational Mechanics Conference
Online ISSN : 2424-2799
2002.15
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Prediction of Electromigration Failure Considering Passivation Thickness
Kazuhiko SASAGAWA, Naoki YOSHIDA, Masataka HASEGAWA, Masumi SAKA, Hiroyuki ABE
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Keywords: Electromigration Failure, Passivated Polycrystalline Line, Failure Prediction, Passivation Thickness
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Pages 319-320

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© 2002 The Japan Society of Mechanical Engineers
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