Abstract
This paper describes the present state of the IEC semiconductor accelerometers standard document development and shows the summary of the technical contents shown in it. The project for semiconductor accelerometers, IEC60747-14-4 was proposed originally by France, but NWIP was submitted by Japan in 2000 at London IEC annual meeting. The FDIS was submitted on this February. Committee for the project is IEC/SC47E/WG1 and corresponding Japanese National Committee exists in JEITA, Japan Electronics and Information Technology Industries Association. The purposes of the document and the difficulties have been to establish the clear difference from the ISO standards such as 16063 and 5347 so that it may contribute to the semiconductor accelerometer industries.
