流体工学部門講演会講演論文集
Online ISSN : 2424-2896
セッションID: F2-4
会議情報
F2-4 Red Brick (ITRS)への挑戦(F.2 半導体製造工程は,今何が問題なのか)
辻村 学太田 正廣
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会議録・要旨集 フリー

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ITRS gave us technical limits on 2005,i.e. Red Brick. In order to break Red Brick, new materials will be adopted in device design side. In process and tool side, wet process is now highlighted to give one of solutions to challenge on Red Brick, such as CMP, ECD etc. Wet process for new materials, ECD for super aspect ratio, CMP for super planarization, cavitation jet cleaning and air flow analysis as dryin-fry-out for contamination control and thermal release problems are shown herein. Thermal and fluid mechanics in nano meter or micron meter level would help science approach in wet revolution decade.
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© 2001 一般社団法人 日本機械学会
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