茨城講演会講演論文集
Online ISSN : 2424-2683
ISSN-L : 2424-2683
セッションID: 302
会議情報
302 CMGによるパターンウエハの平坦化に関する研究(精密/微細加工と評価)
佐々木 淳一敦賀 達也周 立波清水 淳江田 弘
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会議録・要旨集 フリー

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抄録
Recently, as a integrated circuit improves accumulation, the technology progress very rapid in multilayer and miniaturization of architecture. For instance, the Pentium 4 that is CPU for the personal computer is eight layer structure. The technology of planarization process becomes extremely important for multilayer structure. As the solution to multilayer planarization, recently, processes using a fixed abrasive pad or a grinding wheel have been examined as a potential alternative. We proposed the new planarization process named Chemo-Mechanical Grinding. Therefore, in this research, we will experiment by using Shallow Trench Isolation patterned Wafer.
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© 2006 一般社団法人 日本機械学会
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