IIP情報・知能・精密機器部門講演会講演論文集
Online ISSN : 2424-3140
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金属オーバーレイヤー・ラマン散乱分光法による固体材料の表面層構造評価
*山口 誠
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In order to evaluate ultra surface layer of the solid sample, we focused on Surface Enhanced Raman Scattering (SERS) with metal overlayer method. By evaluation of different thickness Ag film on sample surface, it can be observed SERS effect of the ultra surface layer. SERS effect is the largest at a Ag film thickness of 4 nm to 6 nm. It is also observed that the shape of enhanced spectrum around 1300 cm-1 is different. It is considered that the Raman spectra of the ultra surface layer is selectively enhanced.

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