抄録
Our passive-type near-field microscope probes spontaneous evanescent waves derived from local dynamics with a spatial resolution of 20nm. Although our passive microscope has many potential applications. observable samples are restricted to solid samples like metals and dielectrics since deposited metal patterns are necessary for accurate tip positioning. To solve the issue, we propose a new positioning method, in which focused visible laser beam makes a small hot spot on a sample substrate. This hot spot can be substituted for metal patterns for the tip positioning. Experimental verification has confirmed that our new positioning method is valid for our microscope, which opens the door to probing thermal near-field signals on various samples like bio-samples
