Abstract
Glaze-based erbium oxide film was coated on alumina plate in order to enhance emittance of the substrate in the wavelength around 1.5 μm. Scanning electron microscope images showed that film structure could be controlled from glass to porous structure by composition of slurry. In addition, the erbium compound was composed of minute polycrystalline grains and separated from SiO_2 network in the film. The glass structure with much amount of erbium compound was seemed to be optimal to utilize specific infrared radiation emitted from erbium ions.
