年次大会
Online ISSN : 2424-2667
ISSN-L : 2424-2667
2016
セッションID: S1630104
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グリーンデバイス用結晶基板の加工プロセス技術の研究
(革新的研磨パッドの耐久性評価)
菅野 俊彦瀬下 清塚本 敬一大坪 正徳佐伯 卓松永 洋子山崎 努土肥 俊郎
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Silicon carbide is one of the wide-gap semiconductor such as Sapphire and Gallium Nitride, which are being attracted attention as a green device. However, these mentioned materials are hard-to-processes materials. In the Polishing process is required tremendous time consuming to achieve high precision surface, which is regarded hindrance factors to the cost reduction. In order to get the break through, we have developed a dilatancy pad ®. In this paper, polishing reliability and sustainability evaluation is proposed, and succeeded the constant quality even after 100 hours while maintain the processing conditions.

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