抄録
Strain measurement method in the whole view field using random pattern and image correlation is summarized in this paper. There are two major methods for the whole view field strain measurement, using regular grating and random pattern. Major advantage of the method using random pattern is considered that it is not necessary to use grid with regular pattern. Disadvantage is that it is not easy to adjust accuracy of the measurement using various sizes of the random pattern and also much calculation amount is required for correlation method. But CPU power has been raised rapidly these days and is overcoming the latter disadvantage. And also the resolution of CCD devices has increased recently. These progresses of technology in CPU and image capture devices realize remarkable progress in the whole field strain measurement using random pattern.
