年次大会講演論文集
Online ISSN : 2433-1325
会議情報
841 周波数が鉛フーリはんだの BGA 疲労寿命に及ぼす影響
金 永培野口 博司雨海 正純
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会議録・要旨集 フリー

p. 435-436

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Recently, an environment problem has been treated as important. So many studies on a Pb-free material instead of a Pb/Sn alloy have been done actively in microelectronics packaging. Most of them focused on the thermal fatigue of solder joints. On the other hand, there is very little research done to understand the effect of frequency on solder joints when microelectronics devices are subjected to vibrations. In this study, the effect of frequency due to a vibration on a Pb-free IC package and Pb-Sn IC package which are used as BGA interconnecters was researched. The effects of a normal stress, a shear stress and a frequency to a fatigue life was studied. although the normal stress and the shear stress reduce a fatigue life, the shear stress is a dominant factor. The Pb IC package is more sensitive than the Pb-free IC package against a frequency in a range 15∿25Hz.
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© 2002 一般社団法人日本機械学会
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