抄録
Piezoelectric thin films have attracted considerable attention in micro-electromechanical systems. In this study, PZT thin films were deposited directly on Pt-coated SUS substrates using RF magnetron sputtering technique. SUS plate has high mechanical strength and stability, which are suitable properties as a substrate for the deposition of a piezoelectric film rather than a conventional substrate such as Si. The x-ray diffraction measurements revealed that the PZT thin films show polycrystalline structure with a perovskite strucure. Piezoelectric vibration of PZT/SUS unimorph cantilevers was clearly observed and the piezoelectric constant e_<31> of the films was calculated to be -1.6 C/m^2.
