年次大会講演論文集
Online ISSN : 2433-1325
セッションID: 3947
会議情報
3947 ポリイミドフィルム/銅薄膜界面におけるき裂進展抵抗の評価(S21-1 強度物性評価法,S21 ナノ・マイクロ構造体の強度物性と信頼性)
古田 晴典神谷 庄司大宮 正毅
著者情報
会議録・要旨集 フリー

詳細
抄録
Interface adhesion energy between copper and polyimide films, which is used as flexible printed circuits, was evaluated. Contrary to the peel test commonly applied to such a case, interface crack-extension with less amount of plastic deformation was realized by a new technique. On the basis of experimental data, elastic-plastic finite element model was calculated to independently determine the amounts of plastic work and energy consumed to separate the interface during the crack extension process. Both the approaches of total energy balance and work given by nodal force and displacement at the crack tip agreed well and resulted in the same amount of the interface energy release rate.
著者関連情報
© 2006 一般社団法人日本機械学会
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