年次大会講演論文集
Online ISSN : 2433-1325
セッションID: J0601-4-1
会議情報
J0601-4-1 高温熱処理後のSn3Ag0.5Cuはんだ接合部の疲労寿命評価([J0601-4]電子情報機器,電子デバイスの強度・信頼性評価と熱制御(4))
河野 賢哉中 康弘谷江 尚史木本 良輔山本 健一
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会議録・要旨集 フリー

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抄録
The decrease in fatigue life of solder joints under the high temperature environment is a major problem in semiconductor packages for automotive applications. To clarify the mechanism of the fatigue-life decrease, we carried out the mechanical cyclic fatigue test of the Sn3Ag0.5Cu solder joint after high-temperature heat treatment. We studied a correlation between the heat treatment condition and the fatigue-life decrease. The method for estimating the fatigue life decrease from the heating history of heat cycle tests was also studied. The fatigue-life decrease of the solder joints after heat treatment was explained as the temporal change in the fatigue ductile factor of the Coffin-Manson's low, and the decreasing rate of fatigue life was converged within the range from 60 to 70%. We found that the fatigue-life decrease can be quantitatively estimated by using Arrhenius's low with the consideration of the heating temperature, hold time and the number of reliability target cycle of the heat cycle test.
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