Proceedings of JSME-IIP/ASME-ISPS Joint Conference on Micromechatronics for Information and Precision Equipment : IIP/ISPS joint MIPE
Online ISSN : 2424-3132
セッションID: WeA-2-4
会議情報
WeA-2-4 HIGHLY PRECISE POSITIONING X-Y STAGE FOR SCANNING PROVE MICROSCOPY
Akira SakuradaRyo ArakawaShigeki MoriAkihiro NaganawaYotsugi ShibuyaGoro Obinata
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会議録・要旨集 認証あり

詳細
抄録
A highly precise positionning actuator for a Scanning Prove Microscopes (SPM) and a magnetic recording evaluation system was developed. The positionning actuator was consisted of a displacement amplitude mechanism and a stacked piezoelectric element (PE). In this paper, we propose a new X-Y plane positioning actuator composed of two pair of tracking actuator, parallel link with square support spring and positioning stage we mesured. The control performance and the plane positioning accuracy to be verified. Furthermore, the influence of the tracking actuator on the transient response and the out of plane moment of the PE precise positioning stage has be discussed.
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© 2015 一般社団法人 日本機械学会
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