抄録
This paper presented a multiscale simulation of piezoelectric materials. Microstructural features were investigated through EBSD measurement by using an amorphous osmium coating for the preventing charging. Realistic crystal orientations obtained from the EBSD measurement were introduced into multiscale finite element simulations based on homogenization theory to reveal the relationship between the macrostructure and the microstructure. First, a two-dimensional microstructural model was constructed and the effect of the sampling area of EBSD-measured crystal orientations was analyzed. Second, a three-dimensional microstructural model was constructed by the repetition of polishing and EBSD measurement and the influence of the microstructural thickness was investigated. We compared macrostructural homogenized material properties between two- and three-dimensional microstructures.
