抄録
In this study, we have carried out an experimental investigation with regard to the dynamics of the fluid in the vicinity of the boundary line of three phases; solid-liquid-gas interface, which is so-called "contact line", and dynamic behavior of the liquid thin film in front of the moving contact line. This liquid thin film has been known as the precursor film. To visualize the dynamic behavior of the precursor film, we have introduced the novel optical method for real-time and two-dimensional thickness distribution measurement based on conventional ellipsometry and phase-shifting technique. By using this method, the precursor film was visualized, and the length and thickness of the precursor film was measured quantitatively.
