ストレスマイグレーションを活用したAlウィスカの作製とその電気的特性評価について

抄録

When falling below the microscale, various metallic materials have been proven to display unique physical properties and geometrical features compared to their bulk counterparts. In this study, Al whiskers with a diameter below 1 um were produced by utilizing the phenomenon of stress migration, according to which atoms migrate due to a stress gradient in the sample. A handling method through van-der-Waal forces was examined and the results are reported in this paper.