熱工学講演会講演論文集
Online ISSN : 2433-1317
会議情報
C131 リプロンスキャン技術を利用した表面張力分布測定装置の開発(第 3 報)
柴 裕長坂 雄次
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会議録・要旨集 フリー

p. 103-104

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抄録
In the case of semiconductor silicon single crystal growth process by the Czochralski method, it is considered that degradation of the crystal homogeneity may be caused by the Marangoni convection. In coating manufacturing processes using polymer solution, 2-dimensional distribution of surface tension may arise due to temperature and concentration distributions of the organic solvent. In the present study, the surface tension scanning apparatus has been improved, which employs surface laser-light scattering technique (SLLS). In order to confirm the applicability of newly improved apparatus, some preliminary measurements were performed; (1) fixed point measurements of ethanol with open and closed air, (2) fixed point measurement as a function of time and (3) 2-dimensional distribution measurement. Results of the measurements indicate that the present apparatus has a potential to observe 2-dimensional distribution of surface tension "in situ".
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© 2002 一般社団法人日本機械学会
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