抄録
An experimentally simple method utilizing the excitation laser of the Raman system to heat the VA-SWNT film and measure temperature simultaneously for measuring the thermal conductivity and the film-substrate thermal contact resistance of the vertically-aligned single-walled carbon nanotubes (VA-SWNTs) is applied to measure the thermal contact resistance of the transferred film. The method finds the thermal contact resistance at the film-substrate interface of the transferred film to be around four times larger than the original VA-SWNT film grown on Si substrate.
