The Proceedings of Conference of Tokai Branch
Online ISSN : 2424-2748
2012.61
Session ID : 523
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523 Fabrication of the AFM probe with CuO nanowire tip
Hisataka KOTO, Yang JU, Atsushi HOSOI
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Keywords: CuO Nanowire, AFM, Hillock, Stress-induced, Weak Spot
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© 2012 The Japan Society of Mechanical Engineers
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