Proceedings of the 1992 Annual Meeting of JSME/MMD
Online ISSN : 2433-1287
2003
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Failure Prediction in Passivated Polycrystalline Line Considering Passivation Thickness
Kazuhiko SASAGAWA, Masataka HASEGAWA, Masumi SAKA
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Keywords: Electromigration, Governing Parameter, Passivated Polycrystalline Line, Failure Prediction
CONFERENCE PROCEEDINGS FREE ACCESS

Pages 609-610

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© 2003 The Japan Society of Mechanical Engineers
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