新型側傾法用装置による粗大結晶試料のX線応力測定
1976 年 25 巻 268 号 p. 20-26
詳細
1976 年 25 巻 268 号 p. 20-26
A new X-ray diffraction stress analyzer is described in this paper. It has the following features;
(1) Measurements can be switched between the conventional method or the side inclination method,
(2) the side inclination method has η a compensating mechanism, (3) the goniometer is oscillated at right angles to the plane on which the X-ray incident angle is changed during the side inclination method (x-axis oscillation).
X-axis oscillation and Y-axis oscillation (which means the oscillation around the same axis as rotation of Ψ) were experimentally compared for several coarse grained α-iron (211), of which sizes are 15∼300μ.
The results are summarized as follows. (1) The accuracy of the stress measurement for coarse grained specimens depends on the standard deviation of the half value width of the peak profile in every Ψ. (2) X-axis oscillation makes the standard deviation smaller than Y-axis oscillation and has a better effect in oscillation.
