抄録
A new method of X-ray stress measurement was proposed for cubic polycrystals having the [111] fiber texture with the fiber axis perpendicular to the specimen surface. The relation between the strain measured by the X-ray method and the stress was derived on the bases of Reuss and Voigt models. The procedure to determine the residual stresses in aluminum thin films having the [111] fiber texture was presented. The X-ray strain was measured at the inclination angle ψ=0° and 70.5° for 222 diffraction, and ψ=29.5° and 58.5° for 311 diffraction. The values of in-plane stresses, σ11, σ22 and σ12, and out-of-plane stress, σ33, were determined from the measured strains. For the case of equi-biaxial stresses, i.e. σ11=σ22=σ, both models give the identical relation between the X-ray strain and sin2ψ. The stress can be determined from the slope of the linear relation.
