位置敏感型X線検出器による一結晶内の応力測定

抄録

Stresses in a single crystal specimen or any individual grain of polycrystal specimen were measuerd by the use of one dimensional position sensitive proportional counter (PSPC). A problem on such project is how to measure stresses experimentally because continuous Debye-Scherrer (DS) diffraction ring is only just a spot from a grain and appeared on an imaginary DS circle from polycrystal specimen. Therefore, it is important to convert from such a spot to measurable diffraction curve. We adopted a PSPC and a specimen oscillating mechanism in the present study.
Large grained 3% silicone iron specimens were prepared and 211 diffractions on each grain under elastic loading were measured by Cr-Kα x-rays radiation after determination of orientation (n₁n₂n₃) [w₁w₂w₃] on each grain by Laue method. A specimen stage with the ψ and φ rotating attachment was oscillated upon the x-ray irradiated point on the specimen surface in ψ and ψ+90°directions by the use of two stepping motors. The oscillating areas were ±3°in the ψ direction and ±0.5°in the ψ+90°direction, respectively and a measurable diffraction intensity, curve from a DS spot was converted by this operation.
Stresses under uniaxial loading were measured by this technique and we concluded that stresses in a grain can be measured without the use of lattice parameters on the non-stresses condition.