スマートプロセス学会誌
Online ISSN : 2187-1337
Print ISSN : 2186-702X
ISSN-L : 2186-702X
計測分野におけるAI活用事例と今後の展望
御堂 義博
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ジャーナル フリー

2023 年 12 巻 6 号 p. 300-305

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 Optimizing sustainable manufacturing processes using cyber-physical systems (CPS) to improve product lifecycle efficiency, reduce costs, and respond flexibly to changing markets and needs is attracting increasing attention. This paper provides an overview of CPS and then presents examples of AI applications in the field of advanced metrology, which is particularly important for obtaining good virtual models. The potential of data-driven modeling that leverages human knowledge and experience will be demonstrated. In addition, we describe a method for extracting human-interpretable equations from data to support feedback for system improvement. Since these methods are not yet in practical use and CPS is still in the development stage, it is expected that collaboration among various engineers will increase.
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