Crop growth monitoring techniques using remotely sensed data have been required for precise management of crop production. In this study, multi-temporal TerraSAR-X (including TanDEM-X) dual-polarimetric data were used for monitoring the growth of beans and beetroot. In addition to gamma naught values, polarimetric parameters were calculated using m-chi decomposition and dual polarization entropy/alpha decomposition. The results showed that the gamma naught of VV polarization and two polarimetric parameters of the m-chi decomposition (single-or odd-bounce (Odd) and randomly oriented (Rnd) scattering) from X-band SAR data possess potential for monitoring crop growth.
