論文
二, 三の合成高分子化合物のTOF-SIMSフラグメントパターンの推定
2000 年 21 巻 12 号 p. 806-815
詳細
2000 年 21 巻 12 号 p. 806-815
TOF-SIMS fragment patterns of organic polymers: poly (tetrafluoro ethylene), poly vinyl fluoride, poly vinyl chloride etc., can be qualitatively inferred. Considering empirical characteristics of the elements forming these compounds: electron affinity, binding energy and so on, a simple rule to infer fragmentation of these organic polymers, especially poly vinyl halogen compounds, is suggested.
