特集：X線吸収微細構造(XAFS)による表面，界面の解析
偏光全反射蛍光XAFSを用いた金属−酸化物基板界面構造の研究
2002 年 23 巻 6 号 p. 332-338
詳細
2002 年 23 巻 6 号 p. 332-338
We reviewed our recent work on the interface structures between metal and oxide substrate by means of total reflection fluorescence XAFS method. Total reflection fluorescence XAFS gives important information about the 3 dimensional local structure around the deposited metal even if the metal has no long range order. Two systems are described, Cu on TiO2(110) and Ni on Al2O3(0001). Cu on TiO2(110) prepared by CVD method and subsequent reduction at 363 K is in a trimer structure on a TiO2(110) surface. Ni on Al2O3(0001) prepared by a vacuum evaporation was also studied by this method. The initial adsorption site of Ni is determined at a 3 fold hollow site with Ni-O distances at 0.195 nm.
