表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
特集:半導体表面
Si(111)√3×√3-Ag表面の原子揺らぎとSTM像
中村 美道渡邉 聡
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2005 年 26 巻 6 号 p. 329-335

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Recently, a major revision has been made in the interpretation of the STM images of Si(111)√3×√3-Ag surface from the viewpoint of the surface fluctuation. So far, little attention has been paid to the possibility of the surface fluctuation because the STM images of this surface reveal clear arrangement of bright spots. The studies introduced in this article provide not only a unified understanding of the observed STM images of Si(111)√3×√3-Ag surface, but also an important warning to our common tendency to relate STM images revealing clear arrangement of bright spots with a stable structure.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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