表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
特集:高性能電子源が拓く分析装置・計測技術
カーボンナノチューブ電界放射冷陰極を搭載した高分解能X線顕微鏡の開発
畑 浩一藪下 綾介岡田 知幸
著者情報
ジャーナル フリー

2008 年 29 巻 11 号 p. 682-687

詳細
抄録

A high resolution X-ray microscope equipped with a multi-walled carbon nanotube cathode was developed. This system has ordinary scanning electron microscopy functions available for the precise adjustment of focusing conditions including astigmatism and an alignment of an electron beam. By the adoption of a transmission type, X-ray images with high magnification can be easily obtained. The diameter of an electron probe, which is one of the factors limiting a spatial resolution of X-ray microscopes, was estimated to be about 270 nm from a resolution of obtained SEM images. Clear X-ray images with the resolution higher than 400 nm were successfully obtained.

著者関連情報

この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
前の記事 次の記事
feedback
Top