原子分解能を持つ非接触原子間力顕微鏡の開発研究

抄録

Noncontact atomic force microscopy (NC-AFM) achieved not only single atom imaging, but also the single-atom chemical identification by the force spectroscopy and the force mapping. Moreover, by the precise tip-sample distance control around the nearcontact region, AFM achieved not only the conventional vertical and lateral atom manipulation of single atoms, but also the lateral atom interchange manipulation and vertical atom interchange manipulation of heterogeneous atoms that enabled us to construct embedded atom letters at room temperature. Hereafter, AFM/STM simultaneous measurements using the conductive tip will develop toward not only the AFM/STM atomic imaging, but also toward various AFM/STM spectroscopy and atom manipulations.