表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
特集: 走査型プローブ顕微鏡のフロンティア—実用材料表面計測から最新物性問題への挑戦まで—
原子間力顕微鏡によるナノメカニクスの現状と展望
中嶋 健伊藤 万喜子梁 暁斌松江 要
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2017 年 38 巻 10 号 p. 520-525

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Nanomechanics based on atomic force microscope (AFM) is reviewed. Tapping-mode phase imaging gives information of energy dissipative process during the contact between AFM probe and elastic or viscoelastic surface, which includes adhesive interaction as well as viscoelastic loss. The understanding of time-temperature superposition principle is crucial to interpret the data correctly. AFM nanomechanics based on “slow” force-distance curve analysis can also offer a lot of insights on materials’ mechanical properties. Young’s modulus, adhesive force and viscoelastic work can be imaged. The paper devotes AFM analysis of block copolymer-type thermoplastic elastomer, in order to interconnect nanoscopic information and macroscopic mechanical properties evaluation, in which a new mathematical approach, computational homology may play an important role.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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