表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
特集: 多様な表面科学を支える放射光
放射光特性を生かした角度分解光電子分光研究
堀場 弘司組頭 広志
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2017 年 38 巻 11 号 p. 553-558

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Angle-resolved photoemission spectroscopy (ARPES) is a powerful experimental tool for revealing the electronic band structure of solids. Excellent characteristics of synchrotron radiation light enable us to achieve specialized ARPES measurements. In order to perform such experiments, we have constructed a new beamline BL-2 MUSASHI (Multiple Undulator beamline for Spectroscopic Analysis of Surface and Hetero-Interface) at Photon Factory, KEK. As examples of the specialized ARPES measurements by utilizing the advantage of this beamline, we introduce recent ARPES results on ( 1 ) three-dimensional electronic structures with changing the photon energy, ( 2 ) bulk electronic structures using high energy soft x rays, and ( 3 ) orbital-selective electronic structures by polarization dependent ARPES measurements.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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