The technical skill is explained in the XPS analysis of polymeric material surfaces with regard to measuring the topsurface of several nm in thickness. The difference in elemental composition between the surface and the bulk was detected in a different way using mold of molten resin, organic-solvent cast-film, aqueous cast-film and surface-modified film as samples. The mechanism of the difference is considered. It was confirmed that the surface composition might change depending upon the forming conditions during and after the processing. The analyses of the interface inseparable into two surfaces, surface contamination, surface functionals and chemical structure of surface molecules are also described.
