抄録
This paper proposes a methodology for visualizing the electromagnetic field distributions vicinity of the electronic devices. At first, we solve an inverse source problem in order to identify the magnetic field sources from the locally measured magnetic fields. Second, we calculate the magnetic field distributions from the estimated magnetic field sources. Finally, we extract the most dominant magnetic field distributions using the 3D wavelet transform.
In the present paper, basic principle and initial experiments to verify our approach are described. As a result, it is revealed that the magnetic field distributions near the electronic devices can be visualized from the locally measured magnetic fields. Further, we have succeeded in extracting the major magnetic field vectors as well as their sources by the multidimensional analysis of the wavelet transform.
