2000 年 20 巻 1Supplement 号 p. 277-280
We are developing a magnetic domain measurement device under a controlled magnetic field distribution. This work is essentially reduced into solving for an ill-posed inverse problem, because available information is a set of desired magnetic field components caused by a current distribution to de determined. When a number of magnetic field components is greater than those of current components, it is possible to apply a conventional least squares mean under the fixed design variables. In order to work out the optimal design parameters, it is essential to use an objective function, which indicates a fitness parameter between the desired and generated magnetic field distributions. In the present paper, we set up a fitness parameter by means of the multi-resolution analysis of a discrete wavelet transform. As a result, the multi-resolution analysis of the discrete wavelet transform becomes an effective tool for the optimal design of the magnetic field control devices.