可視化情報学会誌
Online ISSN : 1884-037X
Print ISSN : 0916-4731
ISSN-L : 0916-4731
熱の可視化法を利用した基板回路の欠陥検出
櫻田 典世高木 康太郎石井 良夫渡辺 一弘久保田 譲
著者情報
ジャーナル フリー

2001 年 21 巻 2Supplement 号 p. 159-160

詳細
抄録
A cause of fail circuit boards is mainly dominated by a defect of soldering. By leaving this defect, parts on the circuit board are destructed by over current or voltage. A detecting defect of a circuit board is necessary to prevent a circuit board from this destruction. A massed circuit board, however, make it difficult that a lot of parts on the circuit board are detected by a visual inspection. Today, various inspecting devices have been researched and developed using a visible CCD device. More high-precision and high-detecting capability, furthermore, are required for an inspecting devices.
In this study, a new method for a detecting defect has been attractively attempted using a infrared thermography camera. A soldering side of circuit board which was cooled from a behind parts side of the board by cooling board was observed using a thermography camera. From a thermal image which has a different of temperature transition depend on sold-mass, a detection can be achieved whether a mass of sold is optimum or not.
著者関連情報
© 社団法人 可視化情報学会
前の記事
feedback
Top