抄録
A mass spectromerter has been used for the investigation of secondary electron emission from metal surfaces by the impact of ions. The total yield, the ratio of the number of secondary electrons to the number of incident ions, has been measured for electrons ejected from Pt, Au, Ni, and Mo targets without special cleaning by the ions A+, A++, Kr+, Kr++, and C3H7+ (dissociated from n-butane) with the kinetic energy between 800 to 2500 eV.
The total yield increases almost linearly with the increase of ion energy in the range above mentioned.
