抄録
Recent development of spherical aberration correction in high-resolution transmission electron microscopy (Cs-corrected HRTEM) is reviewed by focusing on its application to nano-materials. Basis of the HRTEM imaging and new scientific advantage of Cs-corrected TEM are summarized, and recent applications of the method to high resolution imaging and selected area electron diffraction of nano-materials and interfaces are described as well as explaining its characteristic and the future prospects.
