Attempts to Improve the Sensitivity and the Energy Resolution of an Analyzer for Auger Photoelectron Coincidence Spectroscopy and Electron Ion Coincidence Spectroscopy

Sadanori ARAE; Rui KANEMURA; Kenta HIRAGA; Yosuke OGASHIWA; Kohtaro YANASE; Noritsugu KANAYAMA; Shinya OHNO; Takuhiro KAKIUCHI; Kazuhiko MASE; Koji K. OKUDAIRA; Makoto OKUSAWA; Masatoshi TANAKA

doi:10.3131/jvsj2.56.507

研究論文

Attempts to Improve the Sensitivity and the Energy Resolution of an Analyzer for Auger Photoelectron Coincidence Spectroscopy and Electron Ion Coincidence Spectroscopy

Sadanori ARAE, Rui KANEMURA, Kenta HIRAGA, Yosuke OGASHIWA, Kohtaro YANASE, Noritsugu KANAYAMA, Shinya OHNO, Takuhiro KAKIUCHI, Kazuhiko MASE, Koji K. OKUDAIRA, Makoto OKUSAWA, Masatoshi TANAKA

著者情報

Sadanori ARAE
Department of Physics, Faculty of Engineering, Yokohama National University
Rui KANEMURA
Department of Physics, Faculty of Engineering, Yokohama National University
Kenta HIRAGA
Department of Physics, Faculty of Engineering, Yokohama National University
Yosuke OGASHIWA
Faculty of Education, Gunma University
Kohtaro YANASE
Faculty of Education, Gunma University
Noritsugu KANAYAMA
Department of Electronics and Mechanical Engineering, Faculty of Engineering, Chiba University
Shinya OHNO
Department of Physics, Faculty of Engineering, Yokohama National University
Takuhiro KAKIUCHI
Department of Chemistry, Faculty of Science, Ehime University
Kazuhiko MASE
Institute of Materials Structure Science, KEK
The Graduate University for Advanced Studies
Koji K. OKUDAIRA
Department of Electronics and Mechanical Engineering, Faculty of Engineering, Chiba University
Makoto OKUSAWA
Faculty of Education, Gunma University
Masatoshi TANAKA
Department of Physics, Faculty of Engineering, Yokohama National University

ジャーナルフリー

2013 年 56 巻 12 号 p. 507-510

DOI https://doi.org/10.3131/jvsj2.56.507

詳細

抄録

We constructed two types of coincidence analyzers those can be used for Auger photoelectron coincidence spectroscopy and electron ion coincidence spectroscopy. The first one is designed for high electron energy resolution measurements, and consists of a double-pass coaxially symmetric mirror electron energy analyzer (DP-ASMA), a double-pass cylindrical mirror electron energy analyzer (DP-CMA), a time-of-flight ion mass spectrometer (TOF-MS), a magnetic shield, a conflat flange, an xyz stage, and a tilt adjustment mechanism. The second one is dedicated for high sensitivity measurements, and involves an ASMA with a large pinhole, DP-CMA with a large pinhole, and a TOF-MS.

責任著者(Corresponding author)

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