Journal of the Vacuum Society of Japan
Online ISSN : 1882-4749
Print ISSN : 1882-2398
ISSN-L : 1882-2398
解説
放射光を用いた薄膜評価とダイヤモンドライクカーボン膜の国際標準化
神田 一浩
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ジャーナル フリー

2013 年 56 巻 4 号 p. 117-121

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抄録
  Synchrotron radiation, which has characteristics of high energy, high brilliance, high directionality, and high polarization, is a useful light source for the evaluation of thin film. International standardization project of diamond-like carbon (DLC) film is proceeding on the basis of the measurement of the near edge X-ray absorption fine structure (NEXAFS) spectroscopy using synchrotron radiation. NEXAFS has been utilized as a precise method of sp2 content for DLC films. The sp2 content can be extracted from the NEXAFS spectrum with a high sensitivity and a high quantitativity, because the isolated peak corresponding to carbon 1s→π* resonance transition can be observed.
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© 2013 一般社団法人日本真空学会
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