速報
電界放射顕微鏡および走査プローブ顕微鏡による電子源の評価
2015 年 58 巻 4 号 p. 131-133
詳細
2015 年 58 巻 4 号 p. 131-133
Field emission microscopy (FEM) is commonly used to observe patterns and intensities of electron emissions and to estimate the average work function from the emission current with respect to the applied voltage (F-N plots). However, it is difficult to observe the nanostructure at the apex of the tip using only field emission microscopy. In this research, we observed the nanostructure of a single crystal tungsten 〈100〉 electron emitter covered with barium aluminate by using scanning probe microscopy (SPM). We were able to observe the terrace structure at the top of single crystal tungsten 〈100〉 electron emitter tip. Furthermore, we investigated the correlation between field emission pattern by the FEM and nanostructure of the electron emitter tip by the SPM.
