抄録
Surface x-ray diffraction is a valid method of studying the atomic-scale structure and morphologies of surface and interface. It has been developed to be a powerful tool with the evolution of synchrotron light sources and is being widely used in light of growing importance of surface and interface in science and technology. In this review paper, first, I review the basics of surface x-ray diffraction briefly and then introduce recent progresses in the method of structural analysis and experimental techniques: iterative phase-retrieval method for the direct structural analysis, coherent surface x-ray diffraction for studying inhomogeneous structures, and high-speed measurement techniques for monitoring dynamics at surface and interface. Finally, I briefly mention some future aspects.
