Abstract book of Annual Meeting of the Japan Society of Vacuum and Surface Science
Online ISSN : 2434-8589
Annual Meeting of the Japan Society of Vacuum and Surface Science 2019
Session ID : 1P56
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Investigation of Deterioration of Pt Nanogap Memory Device and Influence of Electrode Under High Temperature Environment
*Kazuki OtsuHiroshi SugaKazuhito TsukagoshiYasuhisa Naitoh
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract

It was reported that studies that the resistive switching effect of Platinum electrodes retains under ultra high temperature condition at 873 K. In this study, we investigate the retention of nanogap-resistance-states in ultra high temperature region above 873 K and clarify the mechanism that inhibits the resistance switch effect in the ultra high temperature region.

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© 2019 The Japan Society of Vacuum and Surface Science
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