Host: The Japan Society of Vacuum and Surface Science
Surrounding a droplet of non-volatile liquid on a solid substrate, thin film region up to several nanometers thick develops over hundreds of micrometers (precursor film). The precursor thin film is connected to the droplet whose potential is controllable, thus provides an opportunity to analyze the electrolyte/electrode interface by surface sensitive techniques. However, the interface at the precursor thin film has not been fully understood. In this study, we performed FM-AFM measurements at the precursor thin film of an ionic liquid on Au(111) and interfacial structural information was obtained by force curve measurements at different film thickness.
