2019 Volume 54 Issue 2 Pages 77-84
Recent developments and applications of aberration-corrected DPC STEM with segmented detector are reviewed. DPC STEM can directly image internal structures of individual atoms by observing atomic electric field as demonstrated by imaging single Au atoms and single layer graphene. Total charge density mapping for GaN crystal using DPC STEM is highlighted, showing direct imaging of electron cloud surrounding atomic nuclei. Some practical applications such as observing pn junction in semiconductors and magnetic skyrmion in helimagmets are shown.