KENBIKYO
Online ISSN : 2434-2386
Print ISSN : 1349-0958
Reviews
Principles and Application of DPC STEM
Naoya Shibata
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2019 Volume 54 Issue 2 Pages 77-84

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Abstract

Recent developments and applications of aberration-corrected DPC STEM with segmented detector are reviewed. DPC STEM can directly image internal structures of individual atoms by observing atomic electric field as demonstrated by imaging single Au atoms and single layer graphene. Total charge density mapping for GaN crystal using DPC STEM is highlighted, showing direct imaging of electron cloud surrounding atomic nuclei. Some practical applications such as observing pn junction in semiconductors and magnetic skyrmion in helimagmets are shown.

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© 2019 The Japanese Society of Microscopy
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