1953 Volume 3 Issue 1 Pages 17-20
The two stage electron microscope is applied to take shadow microscope images, Kossel-Möllenstedt images and electron diffraction images of high resolution. These images have many practical applications as well as theoretical interests. A method to estimate the aberrations of electron lenses by using shadow images is presented. And on shadow images we observe an anomalous contrast, its origin being unknown.